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Proceedings of the 1994 IEEE international conference on microelectronic test structures

Material type: TextTextPublication details: California: Institute of electrical and electronics engineers, Inc., 1994.Description: xi, 224p.; ill.; 28 cmISBN:
  • 0780317580
Subject(s): DDC classification:
  • 621.381 MIC
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Item type Current library Call number Status Date due Barcode
Gifted books Gifted books JRD Tata Memorial Library J.R.D. Tata Memorial Library 621.381 MIC (Browse shelf(Opens below)) Available G1583

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