Normal view MARC view ISBD view

Proceedings of the 1994 IEEE international conference on microelectronic test structures

Proceedings of the 1994 IEEE international conference on microelectronic test structures - California: Institute of electrical and electronics engineers, Inc., 1994. - xi, 224p.; ill.; 28 cm.

ISBN: 0780317580

Subjects--Topical Terms:
Microelectronics
Microelectronic circuits

Dewey Class. No.: 621.381 / MIC

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)