Proceedings of the 1994 IEEE international conference on microelectronic test structures (Record no. 433321)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00551nam a2200145 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250313b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0780317580 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381 |
| Item number | MIC |
| 245 ## - TITLE STATEMENT | |
| Title | Proceedings of the 1994 IEEE international conference on microelectronic test structures |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | California: |
| Name of publisher, distributor, etc | Institute of electrical and electronics engineers, Inc., |
| Date of publication, distribution, etc | 1994. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xi, 224p.; |
| Other physical details | ill.; |
| Dimensions | 28 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Microelectronics |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Microelectronic circuits |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Item type | Gifted books |
No items available.
