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Electron beam ion sources and traps and their applications. EBIS/T 2000. Proceedings. Vol.572 ed. by. Krsto Prelec

By: Contributor(s): Material type: TextTextSeries: AIP conference proceedings. Vol. 572Publication details: Melville American Institute of Physics 2001Description: xiv, 304p. Incl. biblISBN:
  • 0735400113
Subject(s): DDC classification:
  • 539.7212 P01
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 539.7212 P01 (Browse shelf(Opens below)) Available 167634

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