Electron beam ion sources and traps and their applications. EBIS/T 2000. Proceedings. Vol.572 (Record no. 131598)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0735400113 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 539.7212 |
| Item number | P01 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | International symposium on electron beam ion sources and traps and their applications (8 |
| Numeration | 2000 |
| -- | Upton) |
| 245 ## - TITLE STATEMENT | |
| Title | Electron beam ion sources and traps and their applications. EBIS/T 2000. Proceedings. Vol.572 |
| Remainder of title | |
| Statement of responsibility, etc. | ed. by. Krsto Prelec |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Melville |
| Name of publisher, distributor, etc. | American Institute of Physics |
| Date of publication, distribution, etc. | 2001 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 304p. |
| Other physical details | Incl. bibl. |
| 490 ## - SERIES STATEMENT | |
| Series statement | AIP conference proceedings. Vol. 572 |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | EBIS/T 2000; Particles (Nuclear physics); Electron and ion beam optics |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Prelec, Krsto, ed. |
| 919 ## - | |
| -- | 136809 |
No items available.
