Artificial intelligence approach to test generation by Narinder Singh
Material type: BookSeries: The Kluwer international series in engineering and computer science ; 19 ; Publication details: Boston Kluwer Acdemic publishers 1987Description: x, 193pISBN:- 0898381851
- 621.395 N8717
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Reference | JRD Tata Memorial Library | 621.395 N8717 (Browse shelf(Opens below)) | Available | 141808 | |
Book | JRD Tata Memorial Library | 621.395 N8717 (Browse shelf(Opens below)) | Available | 139783 |
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