Artificial intelligence approach to test generation (Record no. 1698)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0898381851 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.395 |
| Item number | N8717 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Singh, Narinder |
| 245 ## - TITLE STATEMENT | |
| Title | Artificial intelligence approach to test generation |
| Statement of responsibility, etc. | by Narinder Singh |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Boston |
| Name of publisher, distributor, etc. | Kluwer Acdemic publishers |
| Date of publication, distribution, etc. | 1987 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | x, 193p. |
| 490 ## - SERIES STATEMENT | |
| Series statement | The Kluwer international series in engineering and computer science ; 19 |
| Volume/sequential designation | |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Integrated circuits- Very large scale integration; Expert systems; Artificial intelligence |
| 919 ## - | |
| -- | 001698 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| JRD Tata Memorial Library | JRD Tata Memorial Library | 24/05/1996 | 621.395 N8717 | 141808 | Reference | |||||
| JRD Tata Memorial Library | JRD Tata Memorial Library | 29/11/2016 | 621.395 N8717 | 139783 | Book |
