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Fundamentals of surface and thin film analysis by Leonard C. Feldman, James W. Mayer by
Material type: Text Text
Publication details: New York North-Holland 1986
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 530.41 N8616.

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Ion implantation in semiconductors : Silicon and germanium /by James W. Mayer, Lennart Eriksson et al. by
Material type: Text Text
Publication details: New York Academic 1970
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38152 N70.

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