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Fundamentals of surface and thin film analysis by Leonard C. Feldman, James W. Mayer

By: Contributor(s): Material type: BookBookPublication details: New York North-Holland 1986Description: vii, 352pISBN:
  • 0444009892
Subject(s): DDC classification:
  • 530.41 N8616
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Holdings
Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 530.41 N8616 (Browse shelf(Opens below)) Available 140575

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