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High-resolution X-Ray scattering: From thin films to lateral nanostructures by Ullrich Pietsch, Vaclav Holy & Tilo Baumbach

By: Contributor(s): Material type: TextTextPublication details: New York Springer 2004Edition: 2nd edDescription: xvi, 408pISBN:
  • 9780387400921
Subject(s): DDC classification:
  • 530.4175 P04 (PHY)
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Item type Current library Call number Status Date due Barcode
Book Book Physics 530.4175 P04 (PHY) (Browse shelf(Opens below)) Available CP2380

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