Normal view MARC view ISBD view

High-resolution X-Ray scattering: From thin films to lateral nanostructures

Pietsch, Ullrich

High-resolution X-Ray scattering: From thin films to lateral nanostructures by Ullrich Pietsch, Vaclav Holy & Tilo Baumbach - 2nd ed - New York Springer 2004 - xvi, 408p.

ISBN: 9780387400921

Dewey Class. No.: 530.4175 / P04 (PHY)

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)