Method to determine the quality of sapphire by M T Duffy, et al

By: Material type: BookBookSeries: Semiconducor measurement technologyPublication details: NJ U S Department of Commerce 1980Description: 61pDissertation: Subject(s): DDC classification:
  • 537.622 N802
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Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 537.622 N802 (Browse shelf(Opens below)) Available 109391

NBSSP: 400-62

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