Method to determine the quality of sapphire (Record no. 62974)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 537.622 |
| Item number | N802 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Duffy, M T, et al |
| 245 ## - TITLE STATEMENT | |
| Title | Method to determine the quality of sapphire |
| Remainder of title | |
| Statement of responsibility, etc. | by M T Duffy, et al |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | NJ |
| Name of publisher, distributor, etc. | U S Department of Commerce |
| Date of publication, distribution, etc. | 1980 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 61p |
| 490 ## - SERIES STATEMENT | |
| Series statement | Semiconducor measurement technology |
| 500 ## - GENERAL NOTE | |
| General note | NBSSP: 400-62 |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Quality of Sapphire |
| 919 ## - | |
| -- | 065197 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| JRD Tata Memorial Library | JRD Tata Memorial Library | 11/06/1997 | 537.622 N802 | 109391 | Reference |
