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Microelectronic test structures. ICMTS 1996. Proceedings

IEEE International conference on microelectronic test structures (1996 Trento)

Microelectronic test structures. ICMTS 1996. Proceedings - New Jersey IEEE 1996 - xi, 313p. incl. bibl.

ISBN: 0780327845

Dewey Class. No.: 621.381548 / N961 "SER"

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