| 000 | 00551nam a2200145 4500 | ||
|---|---|---|---|
| 008 | 250313b |||||||| |||| 00| 0 eng d | ||
| 020 | _a0780317580 | ||
| 082 |
_a621.381 _bMIC |
||
| 245 | _aProceedings of the 1994 IEEE international conference on microelectronic test structures | ||
| 260 |
_aCalifornia: _bInstitute of electrical and electronics engineers, Inc., _c1994. |
||
| 300 |
_axi, 224p.; _bill.; _c28 cm. |
||
| 650 | _aMicroelectronics | ||
| 650 | _aMicroelectronic circuits | ||
| 942 |
_2ddc _cG |
||
| 999 |
_c433321 _d433321 |
||