| 000 | 00604nam a2200193Ia 4500 | ||
|---|---|---|---|
| 919 | _a014640 | ||
| 082 |
_a621.3841340287 _bN90 "SER" |
||
| 245 |
_aSemiconductor thermal and temperature measurement. Proceedings. _b |
||
| 260 |
_aNew York _bIEEE _c1990 |
||
| 300 |
_axiv, 146p _bincl. bibl. |
||
| 690 | _aSemiconductors -Thermal properties; IEEE Components,hybrids & manufacturing Technology Society | ||
| 700 | _aIEEE Symposium on semiconductor thermal and temperature measurement (6: 1990: Scottsdale) | ||
| 964 |
_a _b0 _c _d _e6TH. _f _g |
||
| 999 |
_c14375 _d14375 |
||