| 000 | 00604nam a2200193Ia 4500 | ||
|---|---|---|---|
| 919 | _a133326 | ||
| 020 | _a078036547X | ||
| 082 |
_a621.38154806 _bP "SER" |
||
| 100 |
_aIEEE International test conference (31 _b2000 _bAtlantic City) |
||
| 245 |
_aInternational test conference. ITC 2000. Proceedings _b |
||
| 260 |
_aPiscataway _bIEEE _c2000 |
||
| 300 |
_axiv, 1158p. _cincl. bibl. |
||
| 690 | _aITC 2000; Semiconductor-testing devices; IEEE: Computer Society | ||
| 999 |
_c128249 _d128249 |
||