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1.
LSI/VLSI testability design by Frank F.Tsui by
Material type: Text Text
Publication details: New York McGraw-Hill 1987
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38173 N8716.

2.
Introduction to VLSI testing by Robert J. Feugate and Stephen M. McIntyre by
Material type: Text Text
Publication details: Englewood Cliffs Prentice-Hall 1988
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38173 N8810.

3.
Power-Constrained Testing of VLSI Circuits by
Material type: Text Text
Publication details: Kluwer Academic Publishers
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: circuits -- Very large scale integration -- Protection., 621.39/5/0287.

4.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits by
Material type: Text Text
Publication details: Kluwer Academic Publishers 2000
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.39/5 .

5.
Essentials of Electronic Testing for Digital Memory and Mixed-signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by
Material type: Text Text
Publication details: New York Springer 2000
Availability: Items available for loan: Electronic Systems Engineering (1)Call number: 621.395 P002 (DESE).

6.
Essentials of Electronic Testing for Digital, Memory,and Mixed-Signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by
Material type: Text Text
Publication details: New York Springer 2000
Availability: Items available for loan: Electrical Communication Engineering (1)Call number: 621.395 P002;1 (ECE).

7.
LSI/VLSI testability design by Frank F.Tsui by
Material type: Text Text
Publication details: New York McGraw-Hill 1988
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.3950287 N88.

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