Results of search for 'su:"Electronic measurements"' › JRD Tata Memorial Library catalog

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	1.	Electronic measurement systems by Anton F. P. Van Putten. by Van Putten, Anton F.P Material type: Text Publication details: New York Prentice-Hall 1988 Availability: Items available for reference: Electronic Systems Engineering: Not for loan (1)Call number: 681.2 N88.
	2.	Electronics of measuring systems: Practical implementation of analogue & digital techniques /Tran Tien Lang by Lang, Tran Tien Series: Design and Measurement in Electronic Engineering Material type: Text Publication details: Chichester J-W & Sons 1987 Availability: Items available for reference: Electronic Systems Engineering: Not for loan (1)Call number: 621.381548 N873.
	3.	Cost effective support into the next century proceedings by IEEE Automatic testing conference: System readiness technology conference (30: 1994: Anaheim) Material type: Text Publication details: New Jersey IEEE 1994 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N941 "SER".
	4.	Improving systems effectiveness in the changing environment of the 90's Proceedings. by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1991: Anaheim) Material type: Text Publication details: New York IEEE 1991 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N911 "SER".
	5.	Automatic testing conference. AUTOTESTCON 1992 Conference record by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1992: Dayton) Material type: Text Publication details: New York IEEE 1992 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N921 "SER".
	6.	Enhancing mission effectiveness Proceedings by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1993: San Antonio) Material type: Text Publication details: New Jersey IEEE 1993 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N931 "SER".
	7.	No cover image available Advancing mission accomplishment Conference record. by IEEE Automatic Testing Conference the Systems Readiness Technology Conference. (26 1990 San Antonio) Material type: Text Publication details: New York IEEE 1990 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N90 "SER".
	8.	Instrumentation and measurement. IMTC.1991. Proceedings by IEEE Technical conference on instrumentation and measurement (8 1991 Atlanta) Material type: Text Publication details: New York IEEE 1991 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N912 "SER".
	9.	Smart people, smart instruments, smart measurements. Proceedings by IEEE Technical conference on instrumentation and Measurement (1992: New York) Material type: Text Publication details: New Jersey IEEE 1992 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N922 "SER".
	10.	Instrumentation and measurement. IMTC 1992. Proceedings by IEEE Technical conference on Instrumentation and Measurement (10: 1993: Irvine) Material type: Text Publication details: New Jersey IEEE 1993 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N931 "SER".
	11.	Advanced technologies in Instrumentation and measurement. Proceedings. 3v by IEEE Technical conference on instrumentation and measurement Material type: Text Publication details: New Jersey IEEE 1994 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N94.1-.3 "SER".
	12.	No cover image available Instrumentation and measurement. Proceedings by IEEE Technical conference on instrumentation and measurement (1989 Washington) Material type: Text Publication details: New York IEEE 1989 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N89 "SER".
	13.	No cover image available Emerging measurement technologies. Proceedings by IEEE Technical conference on instrumentation and measurement (7 1990 San Jose) Material type: Text Publication details: New York IEEE 1990 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N90 "SER".
	14.	No cover image available Guidelines, criteria and application proforma for accreditation of calibration laboratories in the field of electronic measurements. by National Coordination of Testing and Calibration Facilities Programme, New Delhi Material type: Text Publication details: New Delhi DST 1988 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N881 "R".
	15.	No cover image available Semiconductor thermal and temperature measurement Proceedings by IEEE symposium on semiconductor thermal and temperature measurement (5 1989 Material type: Text Publication details: New York IEEE 1989 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.3841340287 N89 "SER".
	16.	Electronic instrumentation and measurement techniques by William David Cooper, Albert D.Helfrick by Cooper, William David Helfrick, Albert D Edition: 3rd Material type: Text Publication details: New Delhi Prentice-HaIl of India 1985 Availability: Items available for loan: Aerospace Engineering (1)Call number: 621.381548 N851. Place hold
	17.	Systems readiness: test technology for the 21st century: Conference record by IEEE AUTOTESTCON'95 (1995: Atlanta) Material type: Text Publication details: New Jersey IEEE 1995 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N952 "SER".
	18.	No cover image available Electronic measurments and instrumentation ed. by Bernard M. Oliver and John M. Cage by Oliver, Bernard M Cage, John M Series: Inter-University Electronics Series ; V.12 Material type: Text Publication details: Tokyo McGraw-Hill 1971 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381 N71;4.
	19.	No cover image available Electronic measurements by Frederick Emmons Terman, Joseph Mayo Pettit. by Terman, Frederick Emmons Pettit, Joseph MAyo Series: McGraw-Hill Electrical and Electronic Engineering Series Edition: 2nd Material type: Text Publication details: New York McGraw-Hill 1952 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381043 N52.
	20.	No cover image available Microwave measurements by Edward L. Ginzton. by Ginzton, Edward L Series: International Series in Pure and Applied Physics Material type: Text Publication details: New York McGraw-Hill 1957 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38137 N57.

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