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Frontiers of Characterization and Metrology for Nanoelectronics ed by David G. Seiler, et al.,

By: Contributor(s): Material type: TextTextSeries: AIP Conference Proceedings. Vol.931Publication details: Melville American Institute of Physics 2007Description: xiii, 578p. incl. biblISBN:
  • 9780735404410
Subject(s): DDC classification:
  • 621.3815 P07
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 621.3815 P07 (Browse shelf(Opens below)) Available 181213

CD-ROM INCLUDED

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