Logic testing and design for testability by Hideo Fujiwara
Material type: BookSeries: MIT press series in computer systems ; Publication details: Cambridge MIT 1986Description: x, 284pISBN:- 0262060965
- 621.395 N8627
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Book | JRD Tata Memorial Library | 621.395 N8627 (Browse shelf(Opens below)) | Available | 138889 |
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