Functional test generation for synchronous sequential circuits /by M. K. Srinivas

By: Material type: BookBookSeries: I.I.Sc., Dept of CSA, Ph.D, THESISPublication details: Bangalore IISc. 1994Description: x, 122pSubject(s): DDC classification:
  • 621.3950287 N94 "THESIS"
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Item type Current library Call number Status Date due Barcode
Thesis Thesis JRD Tata Memorial Library 621.3950287 N94 "THESIS" (Browse shelf(Opens below)) Available T03578

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