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	1.	Unified methods for VLSI simulation and test generation by Kwang-Ting Cheng and Vishwani D. Agrawal. by Cheng, Kwang-Ting Agrawal, Vishwani D Series: Kluwer international series in engineering and computer science ; Material type: Text Publication details: Boston Kluwer Press 1989 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.395 N8913.
	2.	Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits by Bushnell, Michael L, Agrawal, Vishwani D Material type: Text Publication details: Kluwer Academic Publishers 2000 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.39/5 . Place hold
	3.	Essentials of Electronic Testing for Digital Memory and Mixed-signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by Bushnell, Michael Agrawal, Vishwani D Material type: Text Publication details: New York Springer 2000 Availability: Items available for loan: Electronic Systems Engineering (1)Call number: 621.395 P002 (DESE). Place hold
	4.	Essentials of Electronic Testing for Digital, Memory,and Mixed-Signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by Bushnell, Michael L Agrawal, Vishwani D Material type: Text Publication details: New York Springer 2000 Availability: Items available for loan: Electrical Communication Engineering (1)Call number: 621.395 P002;1 (ECE). Place hold

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