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Artificial intelligence approach to test generation by Narinder Singh

By: Material type: TextTextSeries: The Kluwer international series in engineering and computer science ; 19 ; Publication details: Boston Kluwer Acdemic publishers 1987Description: x, 193pISBN:
  • 0898381851
Subject(s): DDC classification:
  • 621.395 N8717
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Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 621.395 N8717 (Browse shelf(Opens below)) Not for loan 141808
Book Book JRD Tata Memorial Library 621.395 N8717 (Browse shelf(Opens below)) Available 139783

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