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	1.	High resolution electron microscopy of defects in materials ed. by Robert Sinclair, David J. Smith, Ulrich Dahmen. by Sinclair, Robert., ed Smith, David J., ed Dahmen, Ulrich., ed Series: Materials Research Society Symposium Proceedings V.183 Material type: Text Publication details: Pittsburgh MRS 1990 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 620.11299 N901.
	2.	Characterization of defects in materials ed. by Richard W. Siegel, Julia R. Weertman, Robert Sinclair. by Materials Research Society Symposium on Characterization of Defects in Materials. ( Boston 1986 ) Siegel, Richard W., ed Weertman, Julia R., ed Sinclair, Robert., ed Series: Materials research society symposia proceedings V.82 Material type: Text Publication details: Pittsburgh MRS 1987 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 620.112 N876. Place hold

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