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Characterization of defects in materials ed. by Richard W. Siegel, Julia R. Weertman, Robert Sinclair.

By: Contributor(s): Material type: TextTextSeries: Materials research society symposia proceedings V.82Publication details: Pittsburgh MRS 1987Description: xv, 532pISBN:
  • 0931837472
Subject(s): DDC classification:
  • 620.112 N876
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 620.112 N876 (Browse shelf(Opens below)) Available 142203

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