Your search returned 6 results.

Results
	1.	Physics and chemistry of mercury cadmium telluride and novel IR detector materials Papers /ed. by David G. Seiler by Seiler, David G U.S. Workshop on the Physics & Chemistry of Mercury Cadmium Telluride & Novel Infrared Detector Materials San Francisco 1990 Series: American Institute of Physics. Conference Proceedings ; No.235 Material type: Text Publication details: New York AIP 1991 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381536 N91.
	2.	Characterization and metrology for ULSI technology Proceedings/ed. by David G Seiler by International conference on characterization and metrology for ULSI technology (2 1998 Gaithersburg) Seiler, David G, ed Series: American Institute of Physics. Conference Proceedings. 449 Material type: Text Publication details: Woodbury AIP 1998 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.3950287 N98. Place hold
	3.	Characterization and metrology for ULSI technology 2000. Vol.550 (CD-ROM included) ed. by David G. Seiler et al by Internationl conference on characterization and metrology for ULSI technology (2000 Gaithersburg) Seiler, David G., ed. et al Series: AIP Conference proceedings. Vol. 550 Material type: Text Publication details: Melville American Institute of Physics 2001 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38152 P01.
	4.	Characterization and metrology for ULSI technology. AIP Conference proceedings. Vol.683 (CD-ROM incl) ed by David G Seiler, et al. eds, by International conference on characterization and metrology for ULSI technology (2003 Austin) Seiler, David G., ed. et al Series: AIP Conference proceedings. Vol.683 Material type: Text Publication details: Melville American institute of physics 2003 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38152 P033. Place hold
	5.	Characterization and metrology for ULSI technology ed by David G. Seiler, et al., by Characterization and metrology for ULSI technology (2005 Richardson) Seiler, David G., ed. et al Series: AIP Conference proceedings. Vol.788 Material type: Text Publication details: Melville American institute of physics 2005 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38152 P05. Place hold
	6.	Frontiers of Characterization and Metrology for Nanoelectronics ed by David G. Seiler, et al., by International conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 Gaithersburg) Seiler, David G., ed. et al Series: AIP Conference Proceedings. Vol.931 Material type: Text Publication details: Melville American Institute of Physics 2007 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.3815 P07. Place hold

Copyright © 2024. J.R.D. Tata Memorial Library, Indian Institute of Science, Bengaluru - 560012
Contact Phone: +91 80 2293 2832