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	1.	No cover image available Semiconductor measurement technology ARPA/NBS Workshop III test patterns for integrated circuits by Harry A. Schafft. by Schafft, Harry A Material type: Text Publication details: NBS 1976 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38173 N761.
	2.	No cover image available Semiconductor measurement technology reliability technology for cardiac Pacemakers II a workshop report ed. by Harry A. Schafft. by Schafft, Harry A., ed Material type: Text Publication details: NBS 1977 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 681.761 N77.
	3.	No cover image available Reliability technology for cardiac pacemakers by Harry A. Schafft. by Schafft, Harry A Material type: Text Publication details: U. S. Dept. of Commerce 1976 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 537.622 N761.
	4.	No cover image available Semiconductor measurement technology; reliability technology for cardiac pacemaker ed. by Harry A. Schafft. by Schafft, Harry A Material type: Text Publication details: NBS 1979 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 616.0754 N79.
	5.	No cover image available Moisture measurement technology for hermetic semiconductor devices ed.by Harry A.Schafft. Stanely Rutherberg and Elaine C.Cohen by ARPA/NBS Workshop V, Gaithersburg, MD, March 22-23, 1978 Schafft, Harry A., ed Ruthberg, Stanley., ed Cohen, Elaine C., ed Series: NBS Special Publication 400-69 Material type: Text Publication details: Washington U.S. Department of Commerce 1978 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38152 N81.

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