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	1.	No cover image available Semiconductor measurement technology Laser scanning of active semiconductor devices-videotape script /by David E. Sawyer and David W. by Sawyer, David E. Berning, David W Series: National Bureau of Standards Special Publication ; 400-27 Material type: Text Publication details: Washington NBS 1976 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38152028 N761.
	2.	No cover image available Semiconductor measurement technology measurement of transistors scattering parameters by George J. Rogers, David E. Sawyer and Raman L. Jesch by Rogers George J Sawyer, David E Jesch, Raman L Series: National Bureau of Standards Special Publications 400-5 Material type: Text Publication details: Washington W B S 1976 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381528 N761.

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