Your search returned 3 results.

Results
	1.	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] by Manoj Sachdev and Jos़ Pineda de Gyvez by Sachdev, Manoj Gyvez, Jos़ Pineda de Material type: Text Publication details: Boston Springer 2007 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.395 (e-book). Place hold
	2.	ESD protection device and circuit design for advanced CMOS technologies by Oleg Semenov, Hossein Sarbishaei and Manoj Sachdev by Semenov, Oleg Sarbishaei, Hossein Sachdev, Manoj Material type: Text Publication details: Springer 2008 Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38152 P085;1. Place hold
	3.	ESD protection device and circuit design for advanced CMOS technologies by Oleg Semenov, Hossein Sarbishaei and Manoj Sachdev by Semenov, Oleg Sarbishaei, Hossein Sachdev, Manoj Material type: Text Publication details: Springer 2008 Availability: Items available for loan: Electronic Systems Engineering (1)Call number: 621.38152 P085 (ESE). Place hold

Refine your search