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In-Line Diagnostics for Inkjet Printed Electronics /

By:

Pradeep, Poojari Naga

Contributor(s):

Material type: Text

TextLanguage: en Publication details: Bengaluru : Indian Institute of Science 2025Description: 118 p. : col. ill. ; e-Thesis 5.498 MbSubject(s):

DDC classification:

621.381 PRA

Online resources:

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Dissertation note: MTech (Res) ; 2025 ; Instrumentation and Applied Physics (IAP) Summary: The development of solution processed thin film circuits involves various process stages. One of the key parameters that decides the performance of the circuit is the semiconductor-insulator interface and the quality of the insulator. Usually, the performance of the transistor is ascertained only after all layers are deposited and the transistor is characterized. This work is an attempt to guess the performance of the transistor after the dielectric deposition by using optical methods to extract dielectric quality. The technique can become a part of the manufacturing process to provide feedback and warnings at an early stage of the process flow thereby improving reliability and reducing costs.

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Holdings
Item type	Current library	Call number	URL	Status	Date due	Barcode
Thesis	JRD Tata Memorial Library	"621.381 PRA" (Browse shelf(Opens below))	Link to resource	Not For Loan		ET00973

Includes bibliography

MTech (Res) ; 2025 ; Instrumentation and Applied Physics (IAP)

The development of solution processed thin film circuits involves various process stages. One of the key parameters that decides the performance of the circuit is the semiconductor-insulator interface and the quality of the insulator. Usually, the performance of the transistor is ascertained only after all layers are deposited and the transistor is characterized. This work is an attempt to guess the performance of the transistor after the dielectric deposition by using optical methods to extract dielectric quality. The technique can become a part of the manufacturing process to provide feedback and warnings at an early stage of the process flow thereby improving reliability and reducing costs.

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