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Power-Constrained Testing of VLSI Circuits

By: Material type: TextTextPublication details: Kluwer Academic PublishersDescription: 2003. 191 PagesISBN:
  • 140207235X
Subject(s): DDC classification:
  • circuits -- Very large scale integration -- Protection., 621.39/5/0287
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Item type Current library Call number Status Date due Barcode
E-BOOKS E-BOOKS JRD Tata Memorial Library circuits -- Very large scale integration -- Protection., 621.39/5/0287 (Browse shelf(Opens below)) Available E4870

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