Built-In test for VLSI : Pseudorandom techniques by Paul H Bardell. William H McAnney and Jacob Savir

By:

Contributor(s):

Material type: Text

TextPublication details: New York John wiley 1987Description: xiii, 354pISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	JRD Tata Memorial Library	621.395 N8715 (Browse shelf(Opens below))	Available		139690

There are no comments on this title.

to post a comment.