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Yield modelling and defect tolerance in VLSI ed by Will Moore, Wojciech Maly and Andrzej Strojwas

By: Contributor(s): Material type: TextTextPublication details: Philadelphia Adam hilger 1988Description: vi, 282pISBN:
  • 085274398X
Subject(s): DDC classification:
  • 621.38173 N8829
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 621.38173 N8829 (Browse shelf(Opens below)) Available 137249

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