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Point defects in semiconductors II experimental aspects by J. Bourgoin , M. Lanapp

By: Contributor(s): Material type: TextTextSeries: Springer series in solid state science V35Publication details: Berlin Springer-Verlag 1983Description: xvi, 295pISBN:
  • 3540115153
Subject(s): DDC classification:
  • 537.622 N835
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 537.622 N835 (Browse shelf(Opens below)) Available 121206

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