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Semiconductor measurement technology Permanent damage effects of nuclear radiation on the X-Ban performance of silicon schottky barrier microwave mixer diodes by James M. Kenney. by Series: National Bureau of Standards Special Publications ; 400-17
Material type: Text Text
Publication details: Washington NBS 1976
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381522 N761.

2.
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Semiconductor measurement technology modulation measurements for microwave mixers by James M. Kenney by
Material type: Text Text
Publication details: Washington N B S 1980
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381536 N80.

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