Amazon cover image
Image from Amazon.com

Characterization and metrology for ULSI technology 2000. Vol.550 (CD-ROM included) ed. by David G. Seiler et al

By: Contributor(s): Material type: TextTextSeries: AIP Conference proceedings. Vol. 550Publication details: Melville American Institute of Physics 2001Description: xv, 708p. incl. biblISBN:
  • 156396967X
Subject(s): DDC classification:
  • 621.38152 P01
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 621.38152 P01 (Browse shelf(Opens below)) Not for loan 167229

There are no comments on this title.

to post a comment.

                                                                                                                                                                                                    Facebook    Twitter

                             Copyright © 2024. J.R.D. Tata Memorial Library, Indian Institute of Science, Bengaluru - 560012
                             Contact   Phone: +91 80 2293 2832