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	1.	Cost effective support into the next century proceedings by IEEE Automatic testing conference: System readiness technology conference (30: 1994: Anaheim) Material type: Text Publication details: New Jersey IEEE 1994 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N941 "SER".
	2.	Improving systems effectiveness in the changing environment of the 90's Proceedings. by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1991: Anaheim) Material type: Text Publication details: New York IEEE 1991 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N911 "SER".
	3.	Automatic testing conference. AUTOTESTCON 1992 Conference record by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1992: Dayton) Material type: Text Publication details: New York IEEE 1992 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N921 "SER".
	4.	Enhancing mission effectiveness Proceedings by IEEE Automatic Testing Conference; the Systems Readiness Technology Conference (1993: San Antonio) Material type: Text Publication details: New Jersey IEEE 1993 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N931 "SER".
	5.	No cover image available Automatic testing in the next decade and the 21st. century Proceedings by IEEE Automatic Testing Conference the Systems Readiness Technology Conference. (1989 Philadelphia) Material type: Text Publication details: New York IEEE 1989 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N892 "SER".
	6.	No cover image available Advancing mission accomplishment Conference record. by IEEE Automatic Testing Conference the Systems Readiness Technology Conference. (26 1990 San Antonio) Material type: Text Publication details: New York IEEE 1990 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154806 N90 "SER".
	7.	No cover image available Automatic testing conference, AUTOTESTCON 1977 Proceedings by IEEE Automatic testing conference (1977 massachussetts) Material type: Text Publication details: New York IEEE 1977 Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 629.8 N771 'SER'.

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