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Technology powering the next generation of test. AUTOTESTCON 2005. Conference

By:

IEEE AUTOTESTCON 2005 (2005 Orlando)

Material type: Text

Text

TextPublication details: Piscataway IEEE 2005Description: xxvii, 867p. incl. biblISBN:

0780391012

Subject(s):

AUTOTESTCON 2005; Automatic test systems (ATS); Test program set (TPS); Automated test markup language; Foundry advances; Communications; Information technology; RF minimum sensitivities; Bandwidth; Inertial system precision; Digital processing; Electro-optics sensitivities; Multi-spectral applications; Embedded subsystems; Mixed signal ICs; Sensors; Aerospace; Defense technology; Missile maintenance; Logistics readiness; Aircraft; Transportation; Air force civil engineering; Military services; O-level equipment

DDC classification:

621.38154806 P05 "SER"

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
S	JRD Tata Memorial Library	621.38154806 P05 "SER" (Browse shelf(Opens below))	Available		178448

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