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VLSI Testing Digital and mixed analogue/digital techniques by Stanley L Hurst by Series: IEE circuits, devices and systems series ; 9
Material type: Text Text
Publication details: London Institution of Electrical Engineers 1998
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.395 N9810;1.

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VLSI Testing Digital and mixed analogue/digital techniques by Stanley L Hurst by Series: IEE circuits, devices and systems series ; 9
Material type: Text Text
Publication details: London Institution of Electrical Engineers 1998
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.395 N9810 R(T).

Place hold
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