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Integrated circuit quality and reliability by Eugene R. Huatek.

By: Material type: TextTextPublication details: New York Marcel Dekker 1987Description: xiii, 698pISBN:
  • 0824776682
Subject(s): DDC classification:
  • 621.38173 N871
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Holdings
Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 621.38173 N871 (Browse shelf(Opens below)) Not for loan 133320

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