Fundamentals of surface and thin film analysis by Leonard C. Feldman, James W. Mayer

By:

Contributor(s):

Material type: Text

TextPublication details: New York North-Holland 1986Description: vii, 352pISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	JRD Tata Memorial Library	530.41 N8616 (Browse shelf(Opens below))	Available		140575

There are no comments on this title.

to post a comment.