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High resolution electron microscopy of defects in materials ed. by Robert Sinclair, David J. Smith, Ulrich Dahmen.

Contributor(s): Material type: TextTextSeries: Materials Research Society Symposium Proceedings V.183Publication details: Pittsburgh MRS 1990Description: xii, 391pISBN:
  • 1558990720
Subject(s): DDC classification:
  • 620.11299 N901
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Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 620.11299 N901 (Browse shelf(Opens below)) Not for loan 150599

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