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Evaluation of advanced simeconductor materials by electron microscopy /ed. by David Cherns

By: Contributor(s): Material type: TextTextSeries: NATO ASI SeriesPublication details: New York Plenum 1989Description: 424pISBN:
  • 030643363X
Subject(s): DDC classification:
  • 621.381532 N89
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Item type Current library Call number Status Date due Barcode
Reference Reference Materials Engineering Metallurgy 621.381532 N89 (Browse shelf(Opens below)) Not for loan 154558

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