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1.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits by
Material type: Text Text
Publication details: Kluwer Academic Publishers 2000
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.39/5 .

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Essentials of Electronic Testing for Digital Memory and Mixed-signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by
Material type: Text Text
Publication details: New York Springer 2000
Availability: Items available for loan: Electronic Systems Engineering (1)Call number: 621.395 P002 (DESE).

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Essentials of Electronic Testing for Digital, Memory,and Mixed-Signal VLSI Circuits by Michael L Bushnell and Vishwani D Agrawal by
Material type: Text Text
Publication details: New York Springer 2000
Availability: Items available for loan: Electrical Communication Engineering (1)Call number: 621.395 P002;1 (ECE).

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Design automation by Michael L Bushnell by
Material type: Text Text
Publication details: Boston Academic press 1988
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 620.004250285 N88.

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