Semiconductor measurement technology Defects in PN junctions and MOS capacitors observed using thermally stimulated current capicitance measurements - videotape script/by Martin G. Buehler

By: Material type: TextTextSeries: National Bureau of Standards Special Publication ; 400-26Publication details: Washington NBS 1976Description: iii, 14pSubject(s): DDC classification:
  • 621.381528 N76
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Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 621.381528 N76 (Browse shelf(Opens below)) Not for loan 90097

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