Investigation of damage process in current stressed metal film using noise spectroscopy, scanning thermal microscopy and simulation studies by Achyut Bora

By: Contributor(s): Material type: TextTextPublication details: Bangalore : Indian Institute of Science, 2007.Description: xxiv, 222 p. : col. illSubject(s): DDC classification:
  • 530.4175 P07
Dissertation note: PhD;2007;Physics.
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Item type Current library Call number Status Date due Barcode
Thesis Thesis JRD Tata Memorial Library 530.4175 P07 (Browse shelf(Opens below)) Not for loan T06557

Include CD and bibliography.

PhD;2007;Physics.

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