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21.
Gallium arsenide integrated circuits. GaAsIc Technical digest 1993 by
Material type: Text Text
Publication details: New Jersey IEEE 1993
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.395 N935 "SER".

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22.
Gallium arsenic integrated circuits symposium. GaAsIc Technical digest by
Material type: Text Text
Publication details: New Jersey IEEE 1994
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.395 N948 "SER".

23.
International conference on computer-aided design -digest of technical papers. by
Material type: Text Text
Publication details: Los Alamitos IEEE 1990
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 620.00420285 N902.

24.
Advanced concepts in high speed semiconductor devices Proceedings. by
Material type: Text Text
Publication details: New York IEEE 1991
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.384134 N91 "SER".

25.
advanced concepts in high speed semiconductor devices Proceedings by
Material type: Text Text
Publication details: New Jersey IEEE 1993
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.384134 N93 "SER".

26.
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Cornell conference on advanced concepts in high speed semiconductor devices Proceedings by
Material type: Text Text
Publication details: New York IEEE 1989
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.384134 N89 "SER".

27.
Microelectronics test structures. ICMTS 1991 Proceedings by
Material type: Text Text
Publication details: New York IEEE 1991
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N911 "SER".

28.
Microelectronics test structures. ICMTS 1992 Proceedings by
Material type: Text Text
Publication details: New York IEEE 1992
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N92 "SER".

29.
Microelectronic test structures. ICMTS 1993 Proceedings by
Material type: Text Text
Publication details: New York IEEE 1993
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N932 "SER".

30.
Microelectronic test conference. ICMTS 1994 Proceedings by
Material type: Text Text
Publication details: New Jersey IEEE 1994
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N941 "SER".

31.
Microelectronic test structure. ICMTS 1989. Proceedings. by
Material type: Text Text
Publication details: New York IEEE 1989
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.381548 N891 "SER".

32.
Display research conference record. by
Material type: Text Text
Publication details: New York IEEE 1991
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38154206 N912 "SER".

33.
Electron devices meeting. IEDM 1991 by
Material type: Text Text
Publication details: New York IEEE 1991
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.3810601 N91 "SER".

34.
Electron devices meeting. IEDM 1992 Technical digest by
Material type: Text Text
Publication details: New Jersey IEEE 1992
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.3810601 N92 "SER".

35.
Electron devices meeting. IEDM 1993 Technical digest by
Material type: Text Text
Publication details: New Jersey IEEE 1993
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.3810601 N93 "SER".

36.
Electron devices meeting. IEDM 1994 Technical digest by
Material type: Text Text
Publication details: New Jersey IEEE 1994
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.3810601 N94 "SER".

37.
Pulsed power. Proceedings. vol.1 of 2v /ed. by Kenneth R. Prestwich, William L. Baker by
Material type: Text Text
Publication details: New Jersey IEEE 1993
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38153406 N93.1 "SER".

38.
Reliability physics. IRPS 1992. Proceedings by
Material type: Text Text
Publication details: New York IEEE 1992
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38104206 N92 "SER".

39.
Reliability physics. IRPS 1993 Proceedings by
Material type: Text Text
Publication details: New Jersey IEEE 1993
Availability: Items available for reference: JRD Tata Memorial Library: Not for loan (1)Call number: 621.38104206 N93 "SER".

40.
Reliability physics. IRPS 1994. Proceedings by
Material type: Text Text
Publication details: New Jersey IEEE 1994
Availability: Items available for loan: JRD Tata Memorial Library (1)Call number: 621.38104206 N94 "SER".

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