TY  - BOOK
AU  - International Conference on Defects in Semiconductors. ( Budapest
AU  - Ferenczi, G., ed.
TI  - Defects in semiconductors: part 3
T2  - Materials science forum
SN  - 0878495843
U1  - 537.622 
PY  - 1989///
CY  - Switzerland
PB  - Trans tech.
ER  -