O'Harre, AMF. <br/><br/>
Scanning electron microscopy/1979 sets part 1  an intl review of advances in techniques and applications of the scanningelectron microscope 
by AMF O'Harre. 
 - USA  Scanning Electron Microscopy  1979 
 - x, 597p. 
<br/><br/><label>ISBN: </label>0931288002 
<br/><br/><label>LCCN: </label>72-626068 
<br/><br/><label>Dewey Class. No.: </label>502.8  / N79.1